Carassiti, F., Bemporad, E., Sebastiani, M. (2006). HIGH RESOLUTION MORPHOLOGICAL AND MECHANICAL CHARACTERIZATION OF NIOBIUM FILMS OBTAINED BY MS AND BIASED MS PVD. In Atti del congresso: Thin films and new ideas for pushing the limits of RF Superconductivity.

HIGH RESOLUTION MORPHOLOGICAL AND MECHANICAL CHARACTERIZATION OF NIOBIUM FILMS OBTAINED BY MS AND BIASED MS PVD

CARASSITI, Fabio;BEMPORAD, Edoardo;SEBASTIANI, MARCO
2006-01-01

2006
Carassiti, F., Bemporad, E., Sebastiani, M. (2006). HIGH RESOLUTION MORPHOLOGICAL AND MECHANICAL CHARACTERIZATION OF NIOBIUM FILMS OBTAINED BY MS AND BIASED MS PVD. In Atti del congresso: Thin films and new ideas for pushing the limits of RF Superconductivity.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/180032
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