Bemporad, E., DE FELICIS, D., Carassiti, F. (2002). Improving lateral resolution of SEM/EDS observation by the use of advanced TEM sample preparation techniques in the characterisation of nanostructured coatings. In MicroScience 2002 International Conference and Exhibition London 9-11 July 2002.
Improving lateral resolution of SEM/EDS observation by the use of advanced TEM sample preparation techniques in the characterisation of nanostructured coatings
BEMPORAD, Edoardo;
2002-01-01
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