We discuss calibration issues in wideband (2-20 GHz) surface impedance measurements in a cryogenic and high- magnetic-field environment. We show that, in the case of mea- surements taken on superconducting thin films, the substantial impossibility of a full, three-standard calibration can be partially overcome by exploiting appropriate approximations and the basic properties of superconductors. We discuss a modification of the so-called “short-only” calibration, in order to increase the accuracy of the measurements. We check experimentally the applicability of the approximations at the ground of the method, and we report sample measurements of the surface impedance of a MgB2 superconducting film.

Pompeo, N., S., S., Torokhtii, K., Silva, E. (2015). Cryogenic Microwave Wideband Measurements of Superconducting Thin Films. In Proceedings of I2MTC, 2015 IEEE International Instrumentation and Measurement Technology Conference, Pisa, May 11-14 (2015) [10.1109/I2MTC.2015.7151294].

Cryogenic Microwave Wideband Measurements of Superconducting Thin Films

POMPEO, NICOLA;TOROKHTII, KOSTIANTYN;SILVA, Enrico
2015

Abstract

We discuss calibration issues in wideband (2-20 GHz) surface impedance measurements in a cryogenic and high- magnetic-field environment. We show that, in the case of mea- surements taken on superconducting thin films, the substantial impossibility of a full, three-standard calibration can be partially overcome by exploiting appropriate approximations and the basic properties of superconductors. We discuss a modification of the so-called “short-only” calibration, in order to increase the accuracy of the measurements. We check experimentally the applicability of the approximations at the ground of the method, and we report sample measurements of the surface impedance of a MgB2 superconducting film.
978-1-4799-6113-9
Pompeo, N., S., S., Torokhtii, K., Silva, E. (2015). Cryogenic Microwave Wideband Measurements of Superconducting Thin Films. In Proceedings of I2MTC, 2015 IEEE International Instrumentation and Measurement Technology Conference, Pisa, May 11-14 (2015) [10.1109/I2MTC.2015.7151294].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/191406
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