We present a detailed study carried out on oxide buffer layers grown by Metal-Organic Decomposition (MOD) on metallic substrates for YBa 2Cu3O7-x (YBCO) coated conductor applications. Precursor solutions have been made starting from acetates or pentanedionates and characterized by means of Differential Scanning Calorimetry (DSC) and Thermogravimetric (TG) analyses coupled with Fourier Transform Infra-Red spectroscopy (FT-IR). Thin buffer layers have been grown by spin-coating on Ni-5at.%W substrates. X-ray diffraction spectra (XRD), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) have been employed in order to optimize buffer layers in terms of film microstructure and surface quality, with the final aims of producing a suitable template for YBCO growth. It will be shown that the optimization of the recrystallization process can lead to high quality buffer layer allowing the growth of YBCO films showing good superconductive properties. Copyright © Materials Research Society 2013.
A., A., A. A., A., V., G., F., F., F., R., A., M., et al. (2013). MOD oxide buffer layers on metallic substrates for YBCO coated conductors. In Proceedings of 2013 Materials Research Society Spring Meeting & Exhibit, 1-5 Aprile, San Francisco, California. Materials Research Society [10.1557/opl.2013.1138].
MOD oxide buffer layers on metallic substrates for YBCO coated conductors
SOTGIU, Giovanni;BEMPORAD, Edoardo
2013-01-01
Abstract
We present a detailed study carried out on oxide buffer layers grown by Metal-Organic Decomposition (MOD) on metallic substrates for YBa 2Cu3O7-x (YBCO) coated conductor applications. Precursor solutions have been made starting from acetates or pentanedionates and characterized by means of Differential Scanning Calorimetry (DSC) and Thermogravimetric (TG) analyses coupled with Fourier Transform Infra-Red spectroscopy (FT-IR). Thin buffer layers have been grown by spin-coating on Ni-5at.%W substrates. X-ray diffraction spectra (XRD), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) have been employed in order to optimize buffer layers in terms of film microstructure and surface quality, with the final aims of producing a suitable template for YBCO growth. It will be shown that the optimization of the recrystallization process can lead to high quality buffer layer allowing the growth of YBCO films showing good superconductive properties. Copyright © Materials Research Society 2013.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
