A reversed-wavefront Young interferometer has recently been proposed and demonstrated for a direct measurement of optical coherence. It relies on the creation of a reversed-wavefront replica of an electromagnetic beam in such a way that the coherence function of the initial beam can be mapped out by simple translation of a pair of pinholes in a Young's interference experiment. The same interferometer can, in principle, be used for polarization-dependent coherence measurements, but presents significant challenges. In this paper, we will describe the calibration of the interferometer and show measurements of the polarization-dependent coherence function of two optical sources

Borghi, R., Santarsiero, M., BROWN DEAN, P., SPIELMAN ALEXIS, K., BROWN THOMAS, G., ALONSO MIGUEL, A. (2007). Calibration of a reversed-wavefront interferometer for polarization coherence metrology. In Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III. Proceedings of the SPIE (pp.n° pagine 8).

Calibration of a reversed-wavefront interferometer for polarization coherence metrology

BORGHI, Riccardo;SANTARSIERO, Massimo;
2007-01-01

Abstract

A reversed-wavefront Young interferometer has recently been proposed and demonstrated for a direct measurement of optical coherence. It relies on the creation of a reversed-wavefront replica of an electromagnetic beam in such a way that the coherence function of the initial beam can be mapped out by simple translation of a pair of pinholes in a Young's interference experiment. The same interferometer can, in principle, be used for polarization-dependent coherence measurements, but presents significant challenges. In this paper, we will describe the calibration of the interferometer and show measurements of the polarization-dependent coherence function of two optical sources
2007
Borghi, R., Santarsiero, M., BROWN DEAN, P., SPIELMAN ALEXIS, K., BROWN THOMAS, G., ALONSO MIGUEL, A. (2007). Calibration of a reversed-wavefront interferometer for polarization coherence metrology. In Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III. Proceedings of the SPIE (pp.n° pagine 8).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/271100
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