This paper describes an optoelectronic system for surface roughness measurement. Surface roughness parameter ( ), of a surface characterized by a stationary Gaussian random process, is estimated using Spectral Speckle Correlation (SSC). The system employs two laser diodes as light sources. The paper reports both theory and numerical simulation of the proposed method. In addition, experimental results that confirm the effectiveness of the proposed method are presented.
SCHIRRIPA SPAGNOLO, G. (2004). Optoelectronic system for roughness measurement by SSC method. In Proc. 4th Topical Meeting on "Optoelectronic Distance/Displacement Measurement and Applications - Odimap IV" (pp.54-60). OULU : VIT.
Optoelectronic system for roughness measurement by SSC method
SCHIRRIPA SPAGNOLO, Giuseppe
2004-01-01
Abstract
This paper describes an optoelectronic system for surface roughness measurement. Surface roughness parameter ( ), of a surface characterized by a stationary Gaussian random process, is estimated using Spectral Speckle Correlation (SSC). The system employs two laser diodes as light sources. The paper reports both theory and numerical simulation of the proposed method. In addition, experimental results that confirm the effectiveness of the proposed method are presented.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
