Benvenuti nell'Anagrafe della Ricerca d'Ateneo
La valutazione delle attività di ricerca che si svolgono nelle università ha assunto un'importanza rilevante sia per l'intero sistema universitario sia all'interno di ogni singolo ateneo. Roma Tre si è quindi dotata di idonei strumenti informativi in grado di supportare al meglio le azioni di monitoraggio e di valutazione delle attività di ricerca svolte nei propri dipartimentied ha realizzato una Anagrafe della Ricerca di Ateneo.
EnglishWe discuss calibration issues in wideband (2-20 GHz) surface impedance measurements in a cryogenic and high magnetic field environment. We show that, in the case of measurements taken on superconducting thin films, the substantial impossibility of a full, three-standard calibration can be partially overcome by exploiting appropriate approximations and the basic properties of superconductors. We discuss a modification of the so-called short-only calibration, in order to increase the accuracy of the measurements. We relate the material properties of a sample under study to the measured surface impedance, which is affected by the geometry of the measurement, and we discuss the effects on the proposed approximate calibration procedure. We experimentally check the applicability of the approximations at the ground of the method, and we thoroughly discuss the uncertainties related to the approximations employed. Finally, we report the sample measurements of the surface impedance of two MgB2 superconducting films.
Silva, E., Pompeo, N., Torokhtii, K., & Sarti, S. (2016). Wideband Surface Impedance Measurements in Superconducting Films. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 65(5), 1120-1129 [10.1109/TIM.2016.2534380].
| Titolo: | Wideband Surface Impedance Measurements in Superconducting Films | |
| Autori: | ||
| Data di pubblicazione: | 2016 | |
| Rivista: | ||
| Citazione: | Silva, E., Pompeo, N., Torokhtii, K., & Sarti, S. (2016). Wideband Surface Impedance Measurements in Superconducting Films. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 65(5), 1120-1129 [10.1109/TIM.2016.2534380]. | |
| Handle: | http://hdl.handle.net/11590/299776 | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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http://hdl.handle.net/11590/299776
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