Ultrasound image uniformity is a parameter often used in medical ultrasound system testing, as an object can be displayed in different shapes and textures within the field of view, depending on instrumentation performances. Therefore Ultrasound Image Uniformity evaluation can be used for failures detection as well for quality assurance. In this paper a novel method is developed to measure B-mode image uniformity over the whole field of view or its part (Region Of Interest): it is based on the image gray level histogram weighted by a sigmoid function to detect non uniformities. Preliminary results are explained and discussed.

Scorza, A., Lupi, G., Sciuto, S.A., Battista, L., Galo, J. (2015). A preliminary study on a method for objective uniformity assessment in diagnostic ultrasound imaging. In Conference Record - IEEE Instrumentation and Measurement Technology Conference (pp.1628-1633). Institute of Electrical and Electronics Engineers Inc. [10.1109/I2MTC.2015.7151523].

A preliminary study on a method for objective uniformity assessment in diagnostic ultrasound imaging

SCORZA, ANDREA;LUPI, GIULIA;SCIUTO, SALVATORE ANDREA;BATTISTA, LUIGI;
2015-01-01

Abstract

Ultrasound image uniformity is a parameter often used in medical ultrasound system testing, as an object can be displayed in different shapes and textures within the field of view, depending on instrumentation performances. Therefore Ultrasound Image Uniformity evaluation can be used for failures detection as well for quality assurance. In this paper a novel method is developed to measure B-mode image uniformity over the whole field of view or its part (Region Of Interest): it is based on the image gray level histogram weighted by a sigmoid function to detect non uniformities. Preliminary results are explained and discussed.
2015
978-1-4799-6114-6
Scorza, A., Lupi, G., Sciuto, S.A., Battista, L., Galo, J. (2015). A preliminary study on a method for objective uniformity assessment in diagnostic ultrasound imaging. In Conference Record - IEEE Instrumentation and Measurement Technology Conference (pp.1628-1633). Institute of Electrical and Electronics Engineers Inc. [10.1109/I2MTC.2015.7151523].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/299799
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