Sapphire-based, cylindrical dielectric-loaded microwave resonators are increasingly popular to measure the electrical, magnetic and dielectric response of various substances and materials. While it is generally accepted that 'high-quality' dielectrics are necessary to obtain the best performances of a resonator as a measuring device, a quantitative assessment of the impact of the quality of the anisotropic dielectric on the performances is lacking. We study the effect of a miscut of the crystal on the properties of dielectric resonators, relevant to the performances as a measuring device. We find that mode distortion, sufficiently severe to affect the measurand, can arise with commercial-grade crystals. We give quantitative estimates on the acceptable tolerance on the crystal miscut.

Torokhtif, K., Pompeo, N., Silva, E. (2017). Dielectric-resonator-based measuring devices: Relevance of the dielectric quality. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings (pp.1-6). Institute of Electrical and Electronics Engineers Inc. [10.1109/I2MTC.2017.7969900].

Dielectric-resonator-based measuring devices: Relevance of the dielectric quality

Torokhtif, Kostiantyn
Writing – Original Draft Preparation
;
Pompeo, Nicola
Writing – Original Draft Preparation
;
Silva, Enrico
Writing – Original Draft Preparation
2017-01-01

Abstract

Sapphire-based, cylindrical dielectric-loaded microwave resonators are increasingly popular to measure the electrical, magnetic and dielectric response of various substances and materials. While it is generally accepted that 'high-quality' dielectrics are necessary to obtain the best performances of a resonator as a measuring device, a quantitative assessment of the impact of the quality of the anisotropic dielectric on the performances is lacking. We study the effect of a miscut of the crystal on the properties of dielectric resonators, relevant to the performances as a measuring device. We find that mode distortion, sufficiently severe to affect the measurand, can arise with commercial-grade crystals. We give quantitative estimates on the acceptable tolerance on the crystal miscut.
2017
9781509035960
Torokhtif, K., Pompeo, N., Silva, E. (2017). Dielectric-resonator-based measuring devices: Relevance of the dielectric quality. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings (pp.1-6). Institute of Electrical and Electronics Engineers Inc. [10.1109/I2MTC.2017.7969900].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/326064
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