In this work, an original closed-form approximate evaluation is performed for the continuous-spectrum field excited by an electric-current line source in a substrate-superstrate configuration, optimized for leaky-wave radiation. The validity of these results is shown for the near and the far field at different frequencies, including the frequency range in which the leaky wave is physical and the entire transition region through the spectral gap. This new closed-form result shows explicitly the nature of the continuous-spectrum field in the transition region, and provides insight into the nature of the fields on more complicated structures such as microwave integrated circuits.

Baccarelli, P., Galli, A. (2002). Approximate analytical evaluation of the continuous spectrum in a substrate-superstrate dielectric waveguide. In Proceedings 2002 IEEE MTT-S International Microwave Symposium (pp.953-956). NEW YORK : IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA [10.1109/MWSYM.2002.1011787].

Approximate analytical evaluation of the continuous spectrum in a substrate-superstrate dielectric waveguide

BACCARELLI, PAOLO;GALLI, ALESSANDRO
2002-01-01

Abstract

In this work, an original closed-form approximate evaluation is performed for the continuous-spectrum field excited by an electric-current line source in a substrate-superstrate configuration, optimized for leaky-wave radiation. The validity of these results is shown for the near and the far field at different frequencies, including the frequency range in which the leaky wave is physical and the entire transition region through the spectral gap. This new closed-form result shows explicitly the nature of the continuous-spectrum field in the transition region, and provides insight into the nature of the fields on more complicated structures such as microwave integrated circuits.
2002
9780780372399
Baccarelli, P., Galli, A. (2002). Approximate analytical evaluation of the continuous spectrum in a substrate-superstrate dielectric waveguide. In Proceedings 2002 IEEE MTT-S International Microwave Symposium (pp.953-956). NEW YORK : IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA [10.1109/MWSYM.2002.1011787].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/327895
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