This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.

Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., et al. (2016). A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 (pp.131-134). 345 E 47TH ST, NEW YORK, NY 10017 USA : Institute of Electrical and Electronics Engineers Inc. [10.1109/DFT.2016.7684084].

A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

Fabbri A.;
2016

Abstract

This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.
978-1-5090-3623-3
Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., et al. (2016). A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 (pp.131-134). 345 E 47TH ST, NEW YORK, NY 10017 USA : Institute of Electrical and Electronics Engineers Inc. [10.1109/DFT.2016.7684084].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11590/398595
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