In this contribution, we present and discuss the concepts of virtual perfect matching of reactive loaded circuits and virtual perfect absorption in metasurface-bounded cavities. The anomalous scattering behaviours of the two cases are here analysed through a corresponding transmission line models, showing how it is possible to enable both phenomenon in realistic scenarios and deriving the operative limits for a given reactive load or surface impedance of the metasurface bounding the cavity, respectively. The presented study aims to highlight limits and connections of both virtual effects and derive the proper enabling complex frequency excitation.

Marini, A., Ramaccia, D., Toscano, A., Bilotti, F. (2021). Virtual effects in metasurface-based and circuit systems. In 2021 15th International Congress on Artificial Materials for Novel Wave Phenomena, Metamaterials 2021 (pp.359-361). Institute of Electrical and Electronics Engineers Inc. [10.1109/Metamaterials52332.2021.9577180].

Virtual effects in metasurface-based and circuit systems

Marini A.;Ramaccia D.;Toscano A.;Bilotti F.
2021

Abstract

In this contribution, we present and discuss the concepts of virtual perfect matching of reactive loaded circuits and virtual perfect absorption in metasurface-bounded cavities. The anomalous scattering behaviours of the two cases are here analysed through a corresponding transmission line models, showing how it is possible to enable both phenomenon in realistic scenarios and deriving the operative limits for a given reactive load or surface impedance of the metasurface bounding the cavity, respectively. The presented study aims to highlight limits and connections of both virtual effects and derive the proper enabling complex frequency excitation.
978-1-7281-5018-5
Marini, A., Ramaccia, D., Toscano, A., Bilotti, F. (2021). Virtual effects in metasurface-based and circuit systems. In 2021 15th International Congress on Artificial Materials for Novel Wave Phenomena, Metamaterials 2021 (pp.359-361). Institute of Electrical and Electronics Engineers Inc. [10.1109/Metamaterials52332.2021.9577180].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11590/404393
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