In modern particle accelerators, beam screens play an essential role. Here, the surface impedance becomes one of the characteristics responsible for the performance. A scanning device for nondestructive characterization of the internal surface of the beam screens in terms of its surface resistance is here proposed. The device is based on a dielectric resonator working on the TE011 resonant mode, the most reliable technique for surface impedance measurements. We use extensive electromagnetic simulations to determine the optimal geometry of the dielectric-loaded resonator. We paid particular attention to the low operation frequency and to the sensitivity on the curved inhomogeneous walls of the beam screen within the octagonal-shaped beam screen here considered as an example.
Torokhtii, K., Alimenti, A., Pompeo, N., Silva, E. (2022). Preliminary design of a scanning resonant cell for beam screen surface impedance measurements. In 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (pp.1-6). IEEE [10.1109/I2MTC48687.2022.9806483].
Preliminary design of a scanning resonant cell for beam screen surface impedance measurements
Torokhtii, Kostiantyn
;Alimenti, Andrea;Pompeo, Nicola;Silva, Enrico
2022-01-01
Abstract
In modern particle accelerators, beam screens play an essential role. Here, the surface impedance becomes one of the characteristics responsible for the performance. A scanning device for nondestructive characterization of the internal surface of the beam screens in terms of its surface resistance is here proposed. The device is based on a dielectric resonator working on the TE011 resonant mode, the most reliable technique for surface impedance measurements. We use extensive electromagnetic simulations to determine the optimal geometry of the dielectric-loaded resonator. We paid particular attention to the low operation frequency and to the sensitivity on the curved inhomogeneous walls of the beam screen within the octagonal-shaped beam screen here considered as an example.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.