The microwave part of the electromagnetic spectrum is particularly relevant for any application involving security, defense, and aerospace. As such, accurate characterizations of materials in this frequency range are of utmost relevance to enable proper design of devices, or prediction of the response of materials (coatings, conductors, dielectrics) to microwave irradiation. In this paper we present a novel resonant measuring system able to measure both the surface resistance Rs of conductors and the complex permittivity -i of dielectrics. The experimental system is based on a custom-designed sapphire-loaded cylindrical resonator working at 13 GHz. We show that the setup overcomes the repeatability issues that often affect resonant systems, and it is easy to operate. Measurements reach uncertainties 1mΩ in differential measurements for the surface resistance, and relative uncertainties of 5% and 10% in and respectively.
Alimenti, A., Pompeo, N., Silva, E., Torokhtii, K., Vidal Garcia, P. (2023). Accurate Measurements of Material Properties at Microwave Frequencies. In 2023 IEEE International Workshop on Technologies for Defense and Security, TechDefense 2023 - Proceedings (pp.257-261). Institute of Electrical and Electronics Engineers Inc. [10.1109/TechDefense59795.2023.10380953].
Accurate Measurements of Material Properties at Microwave Frequencies
Alimenti A.;Pompeo N.;Silva E.;Torokhtii K.;Vidal Garcia P.
2023-01-01
Abstract
The microwave part of the electromagnetic spectrum is particularly relevant for any application involving security, defense, and aerospace. As such, accurate characterizations of materials in this frequency range are of utmost relevance to enable proper design of devices, or prediction of the response of materials (coatings, conductors, dielectrics) to microwave irradiation. In this paper we present a novel resonant measuring system able to measure both the surface resistance Rs of conductors and the complex permittivity -i of dielectrics. The experimental system is based on a custom-designed sapphire-loaded cylindrical resonator working at 13 GHz. We show that the setup overcomes the repeatability issues that often affect resonant systems, and it is easy to operate. Measurements reach uncertainties 1mΩ in differential measurements for the surface resistance, and relative uncertainties of 5% and 10% in and respectively.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
