Accurate measurement methods for the reliable characterization of the electrical transport properties of high-temperature superconducting materials are essential for the assessment of their performances and suitability for power applications. In this study, we correlate measurements of critical current Jc in a dc external magnetic field with microwave contactless measurements of the so-called pinning constant kp. While Jc requires patterning of the samples and/or high probe currents, microwave measurements can be performed in as-grown films or tapes, and thus are ideal for evaluating the performances without any further process. The parametric analysis of the correlation between Jc and kp shows a clear correlation, and opens up the possibility of reliably using contactless kp measurements for the evaluation of Jc in pristine samples of technological superconductors.
Alimenti, A., Armenio, A.A., Augieri, A., Celentano, G., Pinto, V., Pompeo, N., et al. (2024). Proposal: a contactless microwave method to assess the critical current of superconducting films. In 2024 IEEE 22nd Mediterranean Electrotechnical Conference, MELECON 2024 (pp.31-35). Institute of Electrical and Electronics Engineers Inc. [10.1109/MELECON56669.2024.10608631].
Proposal: a contactless microwave method to assess the critical current of superconducting films
Alimenti A.;Pompeo N.;Torokhtii K.;Vidal Garcia P.;Silva E.
2024-01-01
Abstract
Accurate measurement methods for the reliable characterization of the electrical transport properties of high-temperature superconducting materials are essential for the assessment of their performances and suitability for power applications. In this study, we correlate measurements of critical current Jc in a dc external magnetic field with microwave contactless measurements of the so-called pinning constant kp. While Jc requires patterning of the samples and/or high probe currents, microwave measurements can be performed in as-grown films or tapes, and thus are ideal for evaluating the performances without any further process. The parametric analysis of the correlation between Jc and kp shows a clear correlation, and opens up the possibility of reliably using contactless kp measurements for the evaluation of Jc in pristine samples of technological superconductors.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
