Accurate measurement methods for the reliable characterization of the electrical transport properties of high-temperature superconducting materials are essential for the assessment of their performances and suitability for power applications. In this study, we correlate measurements of critical current J c in a dc external magnetic field with microwave contactless measurements of the so-called pinning constant k p . While J c requires patterning of the samples and/or high probe currents, microwave measurements can be performed in as-grown films or tapes, and thus are ideal for evaluating the performances without any further process. The parametric analysis of the correlation between J c and k p shows a clear correlation, and opens up the possibility of reliably using contactless k p measurements for the evaluation of J c in pristine samples of technological superconductors.
Alimenti, A., Armenio, A.A., Augieri, A., Celentano, G., Pinto, V., Pompeo, N., et al. (2024). Proposal: a contactless microwave method to assess the critical current of superconducting films. In 2024 IEEE 22nd Mediterranean Electrotechnical Conference (MELECON) (pp.31-35). IEEE [10.1109/melecon56669.2024.10608631].
Proposal: a contactless microwave method to assess the critical current of superconducting films
Alimenti, Andrea;Pompeo, Nicola;Torokhtii, Kostiantyn;Vidal, Pablo;Silva, Enrico
2024-01-01
Abstract
Accurate measurement methods for the reliable characterization of the electrical transport properties of high-temperature superconducting materials are essential for the assessment of their performances and suitability for power applications. In this study, we correlate measurements of critical current J c in a dc external magnetic field with microwave contactless measurements of the so-called pinning constant k p . While J c requires patterning of the samples and/or high probe currents, microwave measurements can be performed in as-grown films or tapes, and thus are ideal for evaluating the performances without any further process. The parametric analysis of the correlation between J c and k p shows a clear correlation, and opens up the possibility of reliably using contactless k p measurements for the evaluation of J c in pristine samples of technological superconductors.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
