Reflecting metasurface design based on statistical local approach

In the future wireless communication systems, Reconfigurable Intelligent Surfaces (RIS) and Smart Skins are playing an important role as disruptive metasurface-based technologies. Designing and fabricating such devices requires a precise modeling and construction methods. However, their performances could be impacted by unpredictability in mutual coupling, errors in the fabrication process, mechanical stress, and thermal deformations. These factors alter their local response, affecting the overall electromagnetic response. In this work, we demonstrate that it is possible to consider such unpredictable deviations already during the design process by using a statistically corrected local design approach. We analytically obtain a surface impedance profile transformation function that makes the metasurface to be more robust to such unpredictable errors. A proper set of numerical simulations demonstrates the robustness of such design considering an anomalous reflective metasurface operating at 10 GHz.