Low-power step-down converters are vital for devices needing lower voltages. Traditional designs use two stages: a rectifier and a flyback or buck-boost converter. Single-stage step-down rectifiers in single-phase systems struggle near zerocrossings of the AC voltage. This paper presents a novel singlestage, single-phase step-down rectifier in Discontinuous Conduction Mode (DCM), optimized for WBG MBS GaN transistors. The design leverages the brief periods when the input is below the output, making it ideal for low-voltage DC supplies (5-1 5 ~ V). It maintains acceptable THD and power factor across a wide input range (110-220 V).

De Paris, V.J., Lima Baschera, N.E., Di Benedetto, M., Waltrich, G., Lazzarin, T.B., Lidozzi, A. (2025). A Novel Single-Phase Buck Rectifier in Discontinuous Conduction Mode. In 2025 Brazilian Power Electronics Conference, COBEP 2025 (pp.1-6). Institute of Electrical and Electronics Engineers Inc. [10.1109/cobep66423.2025.11231723].

A Novel Single-Phase Buck Rectifier in Discontinuous Conduction Mode

De Paris, Valdecir Junior;lima Baschera, Nicolas eugenio;di Benedetto, Marco;Lidozzi, Alessandro
2025-01-01

Abstract

Low-power step-down converters are vital for devices needing lower voltages. Traditional designs use two stages: a rectifier and a flyback or buck-boost converter. Single-stage step-down rectifiers in single-phase systems struggle near zerocrossings of the AC voltage. This paper presents a novel singlestage, single-phase step-down rectifier in Discontinuous Conduction Mode (DCM), optimized for WBG MBS GaN transistors. The design leverages the brief periods when the input is below the output, making it ideal for low-voltage DC supplies (5-1 5 ~ V). It maintains acceptable THD and power factor across a wide input range (110-220 V).
2025
De Paris, V.J., Lima Baschera, N.E., Di Benedetto, M., Waltrich, G., Lazzarin, T.B., Lidozzi, A. (2025). A Novel Single-Phase Buck Rectifier in Discontinuous Conduction Mode. In 2025 Brazilian Power Electronics Conference, COBEP 2025 (pp.1-6). Institute of Electrical and Electronics Engineers Inc. [10.1109/cobep66423.2025.11231723].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/535576
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