Reichmann, F., Mistroni, A., Yamamoto, Y., Kulse, P., Marschmeyer, S., Wolansky, D., et al. (2024). (Invited) Advancing Si Spin Qubit Research: Process Integration of Hall Bar FETs on Si/SiGe in a 200mm BiCMOS Pilot Line. In PRiME 2024 October 6, 2024 - October 11, 2024 Honolulu, USA (pp.109-121) [10.1149/11402.0109ecst].

(Invited) Advancing Si Spin Qubit Research: Process Integration of Hall Bar FETs on Si/SiGe in a 200mm BiCMOS Pilot Line

Capellini, Giovanni
Membro del Collaboration Group
;
2024-01-01

2024
Reichmann, F., Mistroni, A., Yamamoto, Y., Kulse, P., Marschmeyer, S., Wolansky, D., et al. (2024). (Invited) Advancing Si Spin Qubit Research: Process Integration of Hall Bar FETs on Si/SiGe in a 200mm BiCMOS Pilot Line. In PRiME 2024 October 6, 2024 - October 11, 2024 Honolulu, USA (pp.109-121) [10.1149/11402.0109ecst].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/488329
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