This paper investigates how the topology of a dynamical network affects its robustness against exogenous disturbances. We consider Laplacian-based network dynamics, and we adopt the H2 system norm to measure the robustness of the network against disturbances. For networks arising from the composition of atomic structures, we provide a closed-form expression of the robustness against disturbances, and we identify optimal composition rules. Specifically, we show that networks consisting of multiple atomic structures are less robust than each isolated part, and that robust structures arise by interconnecting nodes of the atomic components with highest degree. Finally, we describe an algorithm for the design of robust composite networks.

Santini, R., Gasparri, A., Pasqualetti, F., Panzieri, S. (2016). Network composition for optimal disturbance rejection. In Proceedings of the American Control Conference (pp.3764-3769). Institute of Electrical and Electronics Engineers Inc. [10.1109/ACC.2016.7525499].

Network composition for optimal disturbance rejection

SANTINI, RICCARDO;GASPARRI, ANDREA;PANZIERI, Stefano
2016-01-01

Abstract

This paper investigates how the topology of a dynamical network affects its robustness against exogenous disturbances. We consider Laplacian-based network dynamics, and we adopt the H2 system norm to measure the robustness of the network against disturbances. For networks arising from the composition of atomic structures, we provide a closed-form expression of the robustness against disturbances, and we identify optimal composition rules. Specifically, we show that networks consisting of multiple atomic structures are less robust than each isolated part, and that robust structures arise by interconnecting nodes of the atomic components with highest degree. Finally, we describe an algorithm for the design of robust composite networks.
2016
9781467386821
Santini, R., Gasparri, A., Pasqualetti, F., Panzieri, S. (2016). Network composition for optimal disturbance rejection. In Proceedings of the American Control Conference (pp.3764-3769). Institute of Electrical and Electronics Engineers Inc. [10.1109/ACC.2016.7525499].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11590/315678
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